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Observation of Dislocation in α-Arsenic Single Crystals by X-Ray Diffraction Topography*

  • M. N. Shetty (a1), J. B. Taylor (a1) and L. D. Calvert (a1)

Abstract

X-ray diffraction topographs were obtained from large arsenic single crystals. The camera employed copper Kα, radiation from a microfocus tube and an oscillating assembly of Soller slits limited the beam divergence. Reflections of the type (11) and (20) (primitive rhombohedral cell) were used to characterise dislocation Burgers vectors. The technique has been applied to arsenic single crystals grown from the vapour and from the melt. The majority of dislocations were found to belong to Burgers vectors <10>. Comparison has been made between dislocation etch pit patterns on (111) surfaces and X-ray topographs.

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N.R.C. Postdoctoral fellow.

*

Issued as N.R.C. No.10247.

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References

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1. Taylor, J.B., Bennett, S.L. and Heyding, R.D., “Physical Properties of α and γ Arsenic”. J. Phys. Chem. Solids 26: 6974, 1965.
2. Shetty, M.N. and Taylor, J.B., “Dislocation Etch Pits in Arsenic”. J.Appl.Phys. In press.
3. Shetty, M.N. and Taylor, J.B., “Plastic Deformation of α Arsenic Single Crystals”. J. Appl. Phys. in press.
4. Wells, A.P., “Structural Inorganic Chemistry”. Oxford Press, 1962.
5. Frank, F.C. and Nicholas, J.F., “Stable Dislocations in the Common Crystal Lattices”. Phil. Mag. 44: 12131235, 1953.
6. Hewkirk, J.B., “The Observation of Dislocations and Other Imperfections by X-ray Extinction Contrast”. Trans AIME. 215 : 483497, 1959.
7. Lang, A.R., “Studies of Individual Di sloeatIons in Crystals by X-ray Diffraction Microradiography”. J. Appl. Phys. 30: 17481755, 1959.
8. Carlson, H.A. and Wegner, H. A. R., “Variant in Technique for A.R. Lang's X-ray Diffraction Topography”. J. Appl. Phys. 32: 125126, 1961.
9. Andersen, A.L., “Versatile and Simple Apparatus for X-ray Diffraction. Topography”. Rev. Sci. Instr. 36 : 18881890, 1965.
10. Dionne, G., “High Resolution X-ray Diffraction Topography using Kg Radiation”. J. Appl. Phys. 38: 40944096, 1967.
11. Webb, W.W., “X-ray Diffraction Topography”, in AIME. Proceedings of Technical Conference. St. Louis 1961. Interscience Publishers, New York (1962). pp. 29-76.

Observation of Dislocation in α-Arsenic Single Crystals by X-Ray Diffraction Topography*

  • M. N. Shetty (a1), J. B. Taylor (a1) and L. D. Calvert (a1)

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