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Numerical Calculation of Axial Divergence Profiles

Published online by Cambridge University Press:  06 March 2019

R. A. Coyle
R. A. Coyle*
Affiliation:
Physics Department, Monash University Wellington Rd., Clayton 3168, Vic., Australia
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Abstract

The diffractometer instrumental profiles convoluted by Alexander from aberration profiles calculated using the methods developed Easterbrook, Pike and Wilson include two profiles which are not amenable to exact analytical solution. These two profiles are generated by the axial divergence and flat specimen aberrations. Using ray tracing techniques the exact profiles of these two aberrations have been computed for the Philips PW1050 and Scintag DA5 diffractometers. sample profiles at 2θ = 28°, 90° and 152° have been convoluted with the third asymmetric profile, that due to specimen transparency, and plots of the resultant profiles are shown. Shifts of the centroids and the peaks of the profiles from the true Bragg angle have also been computed and plotted over the range 2θ = 0°-180°.

Type
VIII. XRD Profile Fitting, Crystallite Size and Strain Determination
Information
Advances in X-Ray Analysis , Volume 35 , Issue A: First Pacific-International Congress on X-ray Analytical Methods (PICXAM). Fortieth Annual Conference on Applications of X-ray Analysis, August 7-16, 1991 , 1991 , pp. 611 - 616
Copyright
Copyright © International Centre for Diffraction Data 1991

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References

1 Alexander, L.E., J. Appl. Phys., pl55, 25., 1954.Google Scholar
2 Easterbrook, J.N., Brit. J. of Appl. Phys., p349, 3., 1952.Google Scholar
3 Pike, E.R., J. Sci. Instrum. p355, 34., 1957.Google Scholar
4 Wilson, A. J. C., “Mathematical Theory of Powder Diffraction” Philips Technical Library, Eindhoven, The Netherlands, 1963.Google Scholar