Hostname: page-component-5c6d5d7d68-qks25 Total loading time: 0 Render date: 2024-08-18T07:20:53.476Z Has data issue: false hasContentIssue false
  • English
  • Français

A New Method Of Graphic Representation Of Sample Analysed By XRF

Published online by Cambridge University Press:  06 March 2019

Rodolfo G. Figueroa  and
David G. Caro
Rodolfo G. Figueroa
Affiliation:
Laboratorio FRX Departamenfco de Ciencias Fisicas Universidad de la Frontera Temuco-Chile, Po. Box 54-D
David G. Caro
Affiliation:
Laboratorio FRX Departamenfco de Ciencias Fisicas Universidad de la Frontera Temuco-Chile, Po. Box 54-D
Get access

Extract

XRF nondestructive sample analysis is very convenient when applied to samples that should not be altered, for example, works of art or archeological pieces. When one has various similar samples of this characteristic, a good sample comparison method is necessary. There are various comparison methods among which the three component graphic representation allows a comparison in a throe element component. In an XRF analysis, a large number of peaks, representing emissions from K and L lines normally appear. When a well calibrated spectrum is provided, the determination of the elements in the samples is relatively simple. However, accuracy is difficult to acheive when results from many samples are to be compared.

Type
Research Article
Information
Advances in X-Ray Analysis , Volume 37: Forty-Second Annual Conference on Applications of X-ray Analysis, August 2-6, 1993 , 1993 , pp. 741 - 746
Copyright
Copyright © International Centre for Diffraction Data 1993

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1. Murata, K. J., “A new method of plotting chemical anlysis of basaltic rock”, Am, Jour. Sci. v. 258A, p 247–252, 1960.Google Scholar
2. Church, B. N., “ A New method Identifying common volcanic rocks and illustrating Their Chemical composition” IAVCEI-Simposimn International de Volcanologia, Santiago, Chile, 1-4 Sept 1974.Google Scholar
3. Labreque, J. J., Rosales, P. A. and Carias, O. “ Non Destructive Analysis of Venezuelan Artifacts of Different Sizes for Provenance Studies” Advances in X-Ray analysis, Vol 34 p-307 Plenum Press, NY, (1991).Google Scholar
4. Van Espen, P., Janssens, K. and Swenters, I., “AXIL X Ray Analysis Software”, Dept. of Chemestry, University on Antwerp, U.I.A. Universiteitsplein 1,B-2610 Wilrijk, BelgiumGoogle Scholar