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Measurements of the Thermal Expansion Of Materials with High Melting Points by X-Ray Diffraction

  • Richard Ebner (a1), Michael Mantler (a1) and Michael Hoch (a1)

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X-ray diffraction at temperatures above 2500K gives rise to a wide variety of problems. Not only is there the sample to be heated but also the attachment must be cooled properly, the sample's temperature to be measured and last but not least the sample evaporation to be considered, which sets a limit to the maximum temperature to be reached. There are still other factors limiting the specimen temperature, e.g. an emissivity of the specimen higher than that of the heating strip, a good electicai conductivity or a good thermal conductivity of the specimen material. All these influences were investigated in [1].

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References

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1. Ebner, R., Mantler, M. and Weber, F.: “The Temperature Profiles along Heating-Strips in High Temperature Chambers for XRD”, Adv. in X-Ray Analysis, Vol. 36.
2. American Institute of Physics Handbook, editor: Gray, D.E., 3.ed. (1972)
3. Houska, C.R.: “Thermal Expansion and Atomic Vibration Amplitudes for TiC, TiN, ZrC, ZrN and Pure Tungsten”, J.Phys.Chem.Solids, 25, 1964, 359
4. Richardson, J.H.: “Thermal Expansion of Three Group IV A Carbides to 2700°C”, J.Am.Ceram.Soc, 48 [5], 1965, 236242
5. Mauer, F.A. and Bolz, L.H.: “Measurements of Thermal Expansion of Cermet Components by High Temperature X-Ray Diffraction”, Air Research and Development Command, Wright-Patterson Air Force Base, Ohio, Rept.No. WADC-TR-55-473, Contract No. AF33(616)-53-12, 57 pp., Dec.55
6. Lowrie, R.: “Research on Physical and Chemical Principles Affecting High Temperature Materials for Rocket Nozzels”, Pt.III, pp 26-29, Quaterly Progress Report, Union Carbide Research Institute, Tarrytown, N.Y., Contract No. DA-30-069-ORD-2787, 1062

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