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X-ray diffraction at temperatures above 2500K gives rise to a wide variety of problems. Not only is there the sample to be heated but also the attachment must be cooled properly, the sample's temperature to be measured and last but not least the sample evaporation to be considered, which sets a limit to the maximum temperature to be reached. There are still other factors limiting the specimen temperature, e.g. an emissivity of the specimen higher than that of the heating strip, a good electicai conductivity or a good thermal conductivity of the specimen material. All these influences were investigated in .