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The Measurement of Thermally Induced Structural Changes by High Temperature (900°C) Guinier X-Ray Powder Diffraction Techniques

Published online by Cambridge University Press:  06 March 2019

T. G. Fawcett
Affiliation:
The Dow Chemical Company, Midland, Michigan 48640
P. Moore Kirchhoff
Affiliation:
The Dow Chemical Company, Midland, Michigan 48640
R. A. Newman
Affiliation:
The Dow Chemical Company, Midland, Michigan 48640
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Abstract

A new method for the collection and analysis of high temperature Guinier x-ray data has been devised at The Dow Chemical Co. This technique can be used to monitor various types of structural transformation and thermal expansions up to 900°C. The thermal expansions of α-Al2O3 and two TiO2 structures, anatase and rutile, have been characterized for their use as high temperature internal standards.

Type
IV. XRD Applications and Automation
Copyright
Copyright © International Centre for Diffraction Data 1982

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References

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