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Instrumentation for X-Ray Diffraction Studies of Highly Radioactive Samples

  • Vincent G. Scotti (a1), James I. Mueller (a1) and John J. Little (a1)

Abstract

With the advent of nuclear engineering, x-ray diffraction has become an important analytical tool in the study of radiation damage due to neutron and gamma-ray irradiation. The materials under study in this work have rdioactive levels up to 40 R/hr. at 17 centimeters combined β and γ. The activity of the various samples under study may be due to (n, γ) reactions or fission products or both.

Data are presented to illustrate the use of sample shielding, detector shielding pulse height discrimination and the combination of all three aids in an effort to attain the most favorable peak to background ratio.

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References

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1 Knowles, D. J., 10th Pittsburgh X-Ray and Electron Diffraction Conference (1952), p. 32.
2 Kohler, T. H. and Farrish, W., “X-Ray Diffractometry of Radioactive Samples.” Review of Scientific Instruments, Vol, 26, 1955, p. 26.
3 Curnmings, W. V. Jr., Kaulitz, D. C., and Sanderson, M. J., “Double Diffractomg X-Ray Spectrometer for Study of Irradiated Materials.” Review of Scientific Instruments, Vol. 26, 1955, p. 5.
4 Bredig, M. A., Klein, G. E., and Borie, R. S. Jr., “X-Ray Diffractometer for Highly Radioactive Materials.” Review of Scientific Instruments, Vol. 36, 1955, p. 610.
5 Mueller, J. I., Mayes, R. E., and Simens, H. G., Internal company memorandum, January 2, 1957.

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