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Improved Trace Analysis with the Use of Synchronized Electronic Discrimination in an X-Ray Scanning Procedure

Published online by Cambridge University Press:  06 March 2019

Merlyn L. Salmon*
Affiliation:
FLUO-X-SPEC Laboratory Denver, Colorado
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Abstract

The use of electronic discrimination at a fixed goniometer position for an X-ray spectrographic determination is a conventional means of improving the signal-tonoise ratio and minimizing interferences due to multiple-order diffractions of radiation with shorter wavelengths. The same advantage can be gained with a moving goniometer in a scanning procedure if adjustment of the baseline of the electronic discriminator is properly coordinated with the movement of the goniometer. Å study of optimum baseline levels for various wavelengths in the range of 0.3 to 3.0 Å indicated a hyperbolical correlation of optimum baseline voltage vs. 2θ angle. This experimental correlation is the basis for synchronization of electronic discrimination with movement of the goniometer during the scanning procedure. A suitable mechanism for coordinated baseline adjustment was developed by Technical Equipment Corporation, Denver, Colorado, and improved results are obtained for trace analysis with a scanning technique routinely used for qualitative, semiquantitative determinations for elements with atomic numbers 22 and higher.

Type
Research Article
Copyright
Copyright © International Centre for Diffraction Data 1963

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References

1. Miller, D. C., “Some Considerations in the Use of Pulse Height Analysis with X-Rays,” Norelco Reporter IV (2): 37, 1957. Philips Electronics, Inc., Mount Vernon, New York.Google Scholar
2. Kiley, W. R., “The Function and Application of Counters and the Pulse Height Analyser,” Nordco Reporter VII (6): 143, 1960. Philips Electronic Instruments, Inc., Mount Vernon, New York.Google Scholar
3. Heinrich, K. F. J., “Pulse-Height Selection in X-Ray Fluorescence,” Advances in X-Ray Analysis, Vol. 4, University of Denver, Plenum Press, New York, 1961, p. 370.Google Scholar