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High Spatial Resolution in X-Ray Fluorescence

Published online by Cambridge University Press:  06 March 2019

John D. Zahrt
John D. Zahrt*
Affiliation:
Applied Theoretical Physics Division, Los Alamos National Laboratory
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Extract

During the past eight years or so there has been growing interest in using a polarized x-ray source in energy dispersive x-ray fluorescence spectrometers (1,2,3,4). The effect is to annihilate the source x rays before they scatter into the detector, thus significantly increasing the signal to noise ratio.

Both characteristic or Bremsstrahlung radiation can be polarized by 90° scattering from crystals (Bragg angle = 45°) or from amorphous materials respectively. This 90° polarizing scatter event greatly reduces the incident source radiation on a sample. In an effort to regain some intensity use is made of concave surfaces to utilize a manifold of beams (5,6,7).

Type
II. XRF Techniques and Instrumentation
Information
Advances in X-Ray Analysis , Volume 30: Thirty-Fifth Annual Conference on Applications of X-ray Analysis, August 4-8, 1986 , 1986 , pp. 77 - 83
Copyright
Copyright © International Centre for Diffraction Data 1986

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References

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