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Feasibility of the X-Ray Spectrograph as a Continuous Analytical Instrument for Process Control

  • Robert A. McCune (a1), William M. Mueller (a1) and Pauline J. Dunton (a1)


Studies have been made of the application of X-ray spectrography to continuous analysis for process control. To date the most widespread application of fluorescent X-ray spectrography to process control has been in measurement of plating thickness. Realizing that many other processes could use a method of continuous analysis of moving materials, these studies were undertaken.

A modified tube housing and sample holder was constructed so that material could be passed through the X-ray beam, of a conventional X-ray spectrograph at various linear speeds. Detectability versus material speeds were studied for a number of elements in various mediums.

Application of fluorescent X-ray spectrography as a continuous analytical tool looks very promising. Further studies on specific plant problems should provide useful and advantageous industrial applications of the basic information developed here.



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