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Evaluation of Straight and Curved Braun* Position-Sensitive Proportional Counters on a Huber-Guinier X-Ray Diffraction System

Published online by Cambridge University Press:  06 March 2019

R.A. Newman ,
P. Moore Kirchhoff  and
T.G. Fawcett
R.A. Newman
Affiliation:
The Dow Chemical Company, Midland, Michigan
P. Moore Kirchhoff
Affiliation:
The Dow Chemical Company, Midland, Michigan
T.G. Fawcett
Affiliation:
The Dow Chemical Company, Midland, Michigan
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Abstract

The interfacing of both straight and curved Braun Position- Sensitive Proportional Counters (PSPC's) to a high resolution Huber-Guinier camera system has been accomplished, resulting in a 10 to 100-fold decrease in data collection times when compared to conventional Guinier (film or scintillation counter) detector techniques.

Various factors causing line broadening were evaluated for both PSPC Guinier systems. The depth of the PSPC gas chamber was found to Have the greatest influence on line profiles. An R0% increase in peak half-widths was observed for PSPC-Guinier data compared to our highest resolution Guinier film data, but still yielded significantly better resolution than conventional powder diffractometer data obtained in our laboratory.

Type
III. Position Sensitive Detectors and X-Ray Instrumentation
Information
Advances in X-Ray Analysis , Volume 27: Thirty-Second Annual Conference on Applications of X-ray Analysis, August 1-5, 1983 , 1983 , pp. 261 - 266
Copyright
Copyright © International Centre for Diffraction Data 1983

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Footnotes

*

Distributed in the U.S. by Innovative Technology, Inc.

References

1. Edmonds, J. W. and Henslee, W. W., Adv. in X-ray Analysis, 22:143 (1979). .Google Scholar
2. Snyder, R. L. and Edmonds, J. W., Symposium on Powder Data Collection and Analysis, XII IUCr Congress, Ottawa, Canada (1981).Google Scholar
3. Brown, A., Edmonds, J. W. and Foris, C. M., Adv. in X-ray Analysis, 24:111 (1981).Google Scholar
4. Brown, A., Symposium on Powder Data Collection and Analysis XII lUCr Congress, Ottawa, Canada (1981), also see articles by A. Brown in Adv. in X-ray Analysis, 26:11 and 26:53 (1983).Google Scholar
5. Goebel, H. E., Adv. in X-ray Analysis, 25:315 (1982).Google Scholar
6. Goebel, H. E., Adv. in X-ray Analysis, 22:255 (1979).Google Scholar
7. Goebel, H. E., Adv. in X-ray Analysis, 24:123 (1981).Google Scholar
8. Brown, A. and Edmonds, J. W., Adv. in X-ray Analysis, 23:351 (1980).Google Scholar
9. Klug, H. P. and Alexander, L. E., “X-ray Diffraction Procedures”, John Wiley and Sons, N.Y., N.Y. (1974).Google Scholar