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Evaluation of a Combined Transmission and Scattering Approach to Composition Imaging of Industrial Samples

  • T. H. Prettyraan (a1), R. P. Gardner (a1), J. C. Russ (a1) and K. Verghese (a1)

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Composition imaging of industrial samples has been reported using dual energy and multiple energy transmission computed tomography [1,2]. The simplest approach utilizes monoenergetic sources to obtain tomographs of a sample at two different energies. Each tomograph represents the linear attenuation coefficient distribution of the sample at the given source energy.

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1. Engler, P., Friedman, W. D., and Armstrong, E. E. (1989), “Determination of Material Composition using Dual Energy Computed Tomography on a Medical Scanner”, Proceedings of Industrial Computerized Tomography Topical, ASNT, July 1989, 142-145.
2. Schneberk, D. J., Martz, H., and Azevedo, S. (1991), “Multiple-Energy Techniques in Industrial Corauterized Tomography”, Review af Progress in Quantitative Nondestructive Evaluation, Vol. 9.
3. Hubbel, J. H. (1969), “Photon Cross Sections, Attenuation Coefficients, and Energy Absorption Coefficients from 10 KeV to 100 GeV”, NSRDS-NBS 29.
4. Harding, G., “On the Sensitivity and Application Possibilities of a Novel Compton Scatter Imaging System”, IEEE Transactions on Nuclear Science, NS-29, no. 3, (1982) 12601265.
5. Gardner, R. P., Ely, R. L. Jr. (1967), Radioisotope Measurement Applications in Engineering, Reinhold Publishing Corporation, New York, pp. 262264.
6. Prettyman, T. H., Gardner, R. P., and Verghese, K. (1990), “MCPT: A Monte Carlo Code for Simulation of Photon Transport in Tomographic Scanners”, Nuct. Insir. and Meth. in Phys. Res., A299, 516523.
7. Kondic, N. (1983), “Three-Dimensional Density Field Determination by External Stationary Detectors and Gamma Sources using Selective Scattering”, Proc. of the 2nd International Topical Meeting on Nuclear Reactor Thermal-Hydraulics, American Nuclear Society, Vol. II, pp. 1443-1455.

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Evaluation of a Combined Transmission and Scattering Approach to Composition Imaging of Industrial Samples

  • T. H. Prettyraan (a1), R. P. Gardner (a1), J. C. Russ (a1) and K. Verghese (a1)

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