Skip to main content Accessibility help
×
Home

Elemental and Phase Mapping of Sputtered Binary Plutonium Alloys

  • P. L. Wallace (a1), W. L. Wien (a1), H. F. Rizzo (a1), A. W. Echeverria (a1) and R. P. Goehner (a2)...

Abstract

In this article, we demonstrate that the combination of elemental and phase mapping is a very powerful tool for characterizing sputtered, binary plutonium alloys.

A specially designed energy-dispersive spectrometer equipped with an automated x-y translational stage was used to measure elemental differences in several disks sputter-coated with binary plutonium alloys. Automated diffractometer scans were obtained from selected areas on the disks by using specially designed sample holders. The elemental differences were then correlated with the phases present and the observed corrosion resistance. The elemental spectra and diffractometer scans were analyzed using a modified version of the SPECPLOT program. This program enables the user to analyze both energy-dispersive elemental data and diffractometer data using a single program.

Copyright

References

Hide All
1. Rizzo, H. F. and Echeverria, A.W., Formation of Am orphous Alloys or Metastable Structures in Pu-Fe, Pu-Ta, and Pu -Si Alloys, J. Less-Common Metals, 121: 469 (1986).
2. Rizzo, H.F., Echeverria, A.W., Wien, V.V.L., and Massalski, T.B., Formation of Metastable Structures and Amo rph ou s Phases in Pu-Based Systems Using the Triode Sputtering Technique, presented at the Sixth International Conference on Rapidly Quenched Materials, August 3-7, 1987. To be published in Mater. Sci, Eng.
3. Wallace, P.L., Hosmer, P.K., Walden, J. C., and Haugen, W.L., The Direct Measurement of Ga in Binary Pu -Ga Alloys Using X-ray Spectrometric Techniques, X-ray Spectrom., 7 (4):212 (1978).
4. Criss, J.W., Fundamental-Parameters Calculations on a Laboratory Microcomputer, in “Advances in X-ray Analysis”, 23:87, Plenum Publishing Corp., New York (1980). XRF-11 is confidential, unpublished computer software owned by Criss Software, Inc., 12204 Blaketon Street, Largo, M D 20722 (Copyright 1984),
5. Goehrer, R.P., Specplot An Interactive Data Reduction and Display Program for Spectral Data, in “Advances in X-ray Analysis”, 23:305, Plenum Publishing Corp., New York (1380).
6. Hatfield, W.T., Goehner, R.P., and Lifshin, E, The General Electric Laboratory Automation System, in “Computer Networks in the Ch emical Laboratory”, Levy, G. C. and Terpstra, D., Eds., John Wiley & Sons, New York (1981).
7. Goehrer, R. p., private communication regarding “ Specplot User Manual”, a General Electric internal document (1977).
8. Wallace, P.L., Shimamoto, F.Y., and Quick, T.M., Large-scale Automation of the Lawrence Livermore Laboratory X-ray Analytical Facilities, Lawrence Livermore National Laboratory, Livermore, C A , Rept, UCRL-52953 (1980).

Elemental and Phase Mapping of Sputtered Binary Plutonium Alloys

  • P. L. Wallace (a1), W. L. Wien (a1), H. F. Rizzo (a1), A. W. Echeverria (a1) and R. P. Goehner (a2)...

Metrics

Full text views

Total number of HTML views: 0
Total number of PDF views: 0 *
Loading metrics...

Abstract views

Total abstract views: 0 *
Loading metrics...

* Views captured on Cambridge Core between <date>. This data will be updated every 24 hours.

Usage data cannot currently be displayed