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The Effects of X-Ray Optics on Residual Stress Measurements in Steel

Published online by Cambridge University Press:  06 March 2019

Chester F. Jatczak  and
Harald H. Boehm
Chester F. Jatczak
Affiliation:
Research Division formerly with The Timken Company, The Timken Company Canton, Ohio, U.S.A.
Harald H. Boehm
Affiliation:
Research Division formerly with The Timken Company, The Timken Company Canton, Ohio, U.S.A.
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Abstract

The effects of various combinations of divergence, receiving and Soller slits on x-ray measurements were investigated for Siemens-Halske and General Electric diffractometers. Influences of the following factors which also affect accuracy and precision of x-ray R.S. results were determined in addition: (a) parafocus versus stationary detector focusing geometry, (b) method of peak location, (c) LPA intensity correction, (d) diffractometer electronic stability and (e) elastic constants.

The optimum choiees of beam optics and factors (a-e) were defined with regard to aecuraey, precision and minimurn time for stress deterniination, on sharp and broad line speeimens of soft (annealed) and hardened steel and of annealed Cr-powder.

Type
Research Article
Information
Advances in X-Ray Analysis , Volume 17: Twenty-Second Annual Conference on Applications of X-ray Analysis, August 22-24, 1973 , 1973 , pp. 354 - 370
Copyright
Copyright © International Centre for Diffraction Data 1973

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