Skip to main content Accessibility help
×
Home

Effect of X-ray Tube Window Thickness on Detection Limits for Light Elements in XRF Analysis

  • Daniel J. Whalen (a1) and D. Clark Turner (a1)

Abstract

Widespread interest in light element analysis using XRF has stimulated the development of thin x-ray tube windows. Thinner windows enhance the soft x-ray output of the tube, which more efficiently excite the light elements in the sample. A computer program that calculates the effect of window thickness on light element sample fluorescence has been developed. The code uses an NIST algorithm to calculate the x-ray tube spectrum given various tube parameters such as beryllium window thickness, operating voyage, anode composition, and take-off angle. The interaction of the tube radiation with the sample matrix is modelled to provide the primary and secondary fluorescence from the sample. For x-rays in the energy region 30 - 1000 eV the mass attenuation coefficients were interpolated from the photo absorption data compilation of Henke, et al. The code also calculates the x-ray background due to coherent and incoherent scatter from the sample, as well as the contribution of such scatter to the sample fluorescence. Given the sample fluorescence and background the effect of tube window thickness on detection limits for light elements can be predicted.

Copyright

References

Hide All
1. Pella, P.A., Feng, L., and Small, J.A., X-Ray Spectrometry, 14, 125 (1985).
2. Kramers, M.A., Philos. Mag., 46, 836 (1923).
3. Heirrich, K.F., Electron Beam X-Ray Microanalysis, Van Nostrand Reinhold, NY, (1981), p. 287.
4. Pella, P.A., Feng, L., and Small, J.A., X-Ray Spectrometry, 20, 109 (1990).
5. Green, M. and Cosslett, V.E., Proe. Phys. Soc. London, 78, (1961).
6. Shiralwa, T. and Fujino, N,: Japanese Journal of Appl. Phys., 5, 886 (1966).
7. Krause, M.O., J. Phys. Chem. Ref. Data, 8, 307 (1979).
8. Salem, S.I., Panossian, S.L., and Krause, R., At. Data Nuc. Data Tables, 14, 91 (1974).
9. Heinrieh, K.F.J., The Electron Microprobe, John Wiley, NY, 1966, p. 296.
10. Thinh, T.P. and Lerovrx, J., X-Ray Spectrometry, 8, 85 (1979).
11. Henke, B.L., Gullikson, K.M., and Davis, J.C., At. Data Nuc. Data Tables, 54, 181 (1993).
12. Fernandez, J.E. and Molinere, V.G., Adv. in X-Ray Analysis, 35, 757 (1992).
13. Karydas, A.G. and Paradellis, T., X-Ray Spectrometry, 22, 208 (1993).
14. Pella, P.A. and Cross, B., Adv. in X-Ray Analysis, 33, 509 (1990).
15. Hubbel, J.M.. Veigels, W.J., Griggs, E.A., Brown, R.T.. Cromer, D.T. and Rowerton, R.J., J. Phys. Chem. Ref, Data, 4, 471 (1975).
16. Schaupp, D., Shuinacher, M., Amend, F., and Rullhissen, P., J. Phys. Chem. Ref. Data, 12, 467 (1983).
17. Hubbel, J.H. and Verba, I., J. Phys. Chem. Ref. Data, 8, 69 (1979).

Effect of X-ray Tube Window Thickness on Detection Limits for Light Elements in XRF Analysis

  • Daniel J. Whalen (a1) and D. Clark Turner (a1)

Metrics

Full text views

Total number of HTML views: 0
Total number of PDF views: 0 *
Loading metrics...

Abstract views

Total abstract views: 0 *
Loading metrics...

* Views captured on Cambridge Core between <date>. This data will be updated every 24 hours.

Usage data cannot currently be displayed