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The Effect of Satellite Lines from the X-ray Source on X-ray Diffraction Peaks

Published online by Cambridge University Press:  06 March 2019

Frank E. Briden  and
David F. Natschke
Frank E. Briden
Affiliation:
U.S. Environmental Protection Agency Air and Energy Engineering Research Laboratory Research Triangle Park, NC 27711
David F. Natschke
Affiliation:
Acurex Corporation 4915 Prospectus Drive Durham, NC 27713
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Extract

We have been using crystallite size and strain data obtained from x-ray diffraction (XRD) peak profile analysis to predict the reactivity of solid calcium hydroxide sorbent with acid gases in combustion streams. The development of the method for relating reactivity to crystallite size and strain parameters obtained by the Warren-Averbach technique has been reported by Briden and Natschke and Briden.

The software used for the calculations requires that the XRD peak profile be corrected with a distribution function before application in the Warren-Averbach analysis. The reason for this according to the software developer, Gerhard Zorn, of the Siemens Munich Laboratory, is that he has shown that contributions to the profile from alien peaks and random noise can have serious effects on the Warren-Averbach analysis. The fitting of (he experimental XRD peak with a distribution function provides an effective means for filtering out both contributions.

Type
X. Crystallite Size/Strain Analysis
Information
Advances in X-Ray Analysis , Volume 34: Thirty-Ninth Annual Conference on Applications of X-ray Analysis, July 30 - August 3, 1990 , 1990 , pp. 501 - 506
Copyright
Copyright © International Centre for Diffraction Data 1990

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References

1. Warren, B. E., “X-ray Diffraction,” Addison Wesley Co., Reading, MA (1969), Chapter 13.Google Scholar
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3. Briden, F. E., The Comparison of Several Standard Materials and Techniques for the Warren-Averbach Determination of Microstructure Characteristics of Calcium Hydroxide Sorbent Materials, Advances in X-ray Analysis 33:383, Plenum Press, NY (1990).Google Scholar
4. Zorn, Gr., Pitfalls in the Evaluation of Diffraction Line Shape, The Australian J. of Phys., 41: 41 (1988).Google Scholar
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