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Detector Background And Sensitivity Of Semiconductor X-Ray Fluorescence Spectrometers

  • F. S. Goulding (a1), J. M. Jaklevic (a1), B. V. Jarrett (a1) and D. A. Landis (a1)

Abstract

Degraded detector pulses are shown to contribute most of the background in spectra produced by semiconductor-detector X-ray spectrometers. A new guard-ring detector is used with appropriate circuits to reduce background by a large factor. We discuss the sensitivity of the new arrangement with various excitation sources.

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References

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1. Miller, G. L., private communication referenced in Llacer's paper (Ref, 2) p. 99.
2. Llacer, J., “Geometric Control of Surface Leakage Current and Noise in Lithium Drifted Silicon Radiation Detectors”, IEEE Trans. Nucl. Sci. NS-13, No. 1, p. 93 (1966).
3. Hansen, W. and Goulding, F. S., “Leakage, Noise, Guard Rings and Resolution in Detectors”, Proceedings of Asheville Conference NAS-NRC Report No. 32, 202 (1961).
4. Jaklevic, J. M., Giauque, R. D., Malone, D. F. and Searles, W. L., “Small X-ray Tubes for Energy Dispersive Analysis Using Semi conductor Spectrometers”, Lawrence Berkeley Laboratoiy Report No, LBL-10. Presented at the 20th Annual Denver X-ray Conference Aug. 11-13, 1971.
5. Goulding, F. S. and Jaklevic, J. M., “Trace Element Analysis by X-ray Fluorescence”, Lawrence Radiation Laboratory Report No. UCRL-20625, Berkeley, California 94720.
6. Goulding, F. S. and Stone, Y., “Semiconductor Radiation Detectors”, Science Vol. 170, 280 (1970).

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