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Calculation and Measurement of Integral Reflection Coefficient Versus Wavelength of “Real” Crystals on an Absolute Basis

  • D. B. Brown (a1), M. Fatemi (a1) and L. S. Birks (a1)

Abstract

A method for calculation of the integral reflection coefficient of crystals of interrnediate perfection is introduced. This method can greatly reduce experimental effort for the selection and calibration of crystals, It also serves as a conceptual framework for studies of mosaic block structure and of crystal modification. Good agreement between calculated and experimental values of the integral reflection coefficient is shown for, (a) LiF crystals of two degrees of perfection, (b) elastically bent quartz, and (c) 001, 005, 006, and 007 diffraction from KAP. Zachariasen's division of crystals into two types is extended. It is concluded that the integral reflection coefficients for 200 LiF cannot be raised to the ideally imperfect limiting values.

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References

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1. Zachariasen, W. H., “A General Theory of X-Ray Diffraction in Crystals,Acta Cryst. 23, 558564 (1967).
2. Birks, L. S. and Seal, R. T., “X-Ray Properties of Deformed LiF,Phys J. Appl., 28, 541543 (1957).
3. Vierling, J., Gilfrich, J. V., and Birks, L. S., “Improving the Diffracting Properties of LiF,Appl. Spectry. 23, 342345 (1969).
4. White, J. E., “X-Ray Diffraction by Elastically Deformed Crystals,” J. Appl. Phys, 21, 855859 (1950).
5. Burkhalter, P. G., Whitlock, R. R., Gilfrich, J. V., and Birks, L. S., Naval Research Laboratory, unpublished data,
6. Birks, L. S., “Electron Probe Microanalysis,” p. 75 ff., John Wiley (1963); or p . 43 ff., John Wiley (1971).

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