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Automatic Computer Measurement of Selected Area Electron Diffraction Patterns from Asbestos Minerals

  • J. C. Russ (a1), T. Taguchi (a2), P. M. Peters (a3), E. Chatfield (a4), J. C. Russ (a5) and W. D. Stewart (a6)...

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Conventional selected area diffraction patterns as obtained in the TEM present difficulties for identification of materials such as asbestifonn minerals, although diffraction data is considered to be one of the preferred methods for making this identification. The preferred orientation of the fibers in each field of measurement, and the spotty patterns that are obtained, do not readily lend themselves to measurement of the integrated intensity values for each dspacing, and even the d-spacings may be hard to determine precisely because the true center location for the broken rings requires estimation. To overcome these problems, we have implemented an automatic method for diffraction pattern measurement. It automatically locates the center of patterns with high precision, measures the radius of each ring of spots in the pattern, and integrates the density of spots in that ring.

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1. Heinrich, K.F.J., ed. (1980) Characterization of Particles National Bureau of Standards Special Publication 533
2. Russ, J.C. (1988) The Analysis and Measurement of Images, Engineering Extension Service, North Carolina State University, Raleigh NC
3. C, P.V.. Hough (1982) Method and Means for Recognizing Complex Patterns Patent, U.S. 3069654, Dec. 18, 1962
4. Duda, R.O., Hart, P.E. (1972) Use of the Hough Transformation to Detect Lines and Curves in Pictures Comm. Assoc. Comput. Mach, 1. 1115
5. Ballard, D.H. (1981) Generalizing the Hough Transform to Detect Arbitrary ShapesPattern Recognition 13 #2, 111-122
6. Gonzalez, R.C., Wintz, P. (1987) Digital Image Processing, Addison Wesley, Reading MA
7. Russ, J.C. (1988) Automatic Methods for the measurement of curvature of lines, features and feature alignment in images Journal of Computer-Assisted Microscopy (in press)
8. Thetaplus+, Dapple Systems, 355 W. Olive Ave. , Sunnyvale, CA 94086
9. JCPDS, International Centre for Diffraction Data, 1601 Park Lane, Swarthmore, PA 19081
10. Russ, J.C., Hare, T.M., Lanzo, M.J. X-ray Diffraction Phase Analysis using Microcomputers, in Advances in X-ray Analysis vol. 25 (Russ, J.C. et. al. , ed,) Plenum Press, 1982
11. Bright, D.S., Steel, E.B. Automatic Extraction of Regular Arrays of Spots from Electron Diffraction Images, J. of Microscopy, in press
12. Carr, M.J. Automation of Electron Diffraction Analysis in an Analytical EM, in Electron Microscopy 1981 (Geiss, R.H., ed. ) San Francisco Press, p. 139146

Automatic Computer Measurement of Selected Area Electron Diffraction Patterns from Asbestos Minerals

  • J. C. Russ (a1), T. Taguchi (a2), P. M. Peters (a3), E. Chatfield (a4), J. C. Russ (a5) and W. D. Stewart (a6)...

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