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Automated Measurement of Grain Orientations and On-Line Determination of Complete Deformation Systems with a TEM

Published online by Cambridge University Press:  06 March 2019

R. A. Schwarzer  and
S. Zaefferer
R. A. Schwarzer
Affiliation:
Institut für Metallkunde und Metallphysik D-38678 Clausthal-Z., Germany
S. Zaefferer
Affiliation:
Institut für Metallkunde und Metallphysik D-38678 Clausthal-Z., Germany
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Extract

An automated computer technique for the indexing of spot or transmission Kikuchi patterns from any crystal structure has been developed. The patterns are recorded from the fluorescence screen of a PHILIPS EM 430 TEM with an integrating, Peltier cooled CCD camera (PULNIX TM 86QN) through a window from outside by replacing the focusing binocular. The frame-grabber board PCLL2 (SPINDLER & HOYER) has a resolution of 8 bit which corresponds to 256 grey levels. To reduce the high range of image contrastj a circular continuous density filter is positioned directly in front of the camera lens.

Type
IV. New Developments in X-Ray Sources, Instrumentation and Techniques
Information
Advances in X-Ray Analysis , Volume 38: Forty-third Annual Conference on Applications of X-ray Analysis , 1994 , pp. 377 - 381
Copyright
Copyright © International Centre for Diffraction Data 1994

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References

[1] Schwarzer, R.A., Zaefferer, S. and Kunze, K.: Advances in X-Ray Analysis 38: thin volume Google Scholar
[2] Adams, B.L., Wright, S.I. and Kunze, K.: Metallurg. Trans. 24A: S19–831 (1993)Google Scholar
[3] Schwarzer, R.A.: Beitr. elektronenmikroskop. Direktabb. Oberfl. 18: 61–68 (1985)Google Scholar
[4] Krieger, N.C. Lassen, D. Jensen, Juul and Conradsen, K.: Scanning Microscopy 6: 115–123 (1992)Google Scholar
[5] Weiland, H. and Schwarzer, R.A.: Beitr. elektronenmikrosk. Direktabb. Oberfl. 18: 55–60 (1985)Google Scholar
[6] Schwarzer, R.A. and Weiland, H: Textures and Microstructures 8&9: 531–577 (1988)Google Scholar