Hostname: page-component-77c89778f8-m8s7h Total loading time: 0 Render date: 2024-07-18T12:21:03.612Z Has data issue: false hasContentIssue false
  • English
  • Français

Absorption Corrections via Backscattered Radiation in Polychromatic Excitation Energy-Dispersive X-ray Fluorescence Spectrometry

Published online by Cambridge University Press:  06 March 2019

F. Araüjo ,
F. He ,
P. Van Espen  and
R. Van Grieken
F. Araüjo
Affiliation:
Department of Chemistry, University of Antwerp (UIA), B-2610 Antwerp - Wilrijk, Belgium
F. He
Affiliation:
Department of Chemistry, University of Antwerp (UIA), B-2610 Antwerp - Wilrijk, Belgium
P. Van Espen
Affiliation:
Department of Chemistry, University of Antwerp (UIA), B-2610 Antwerp - Wilrijk, Belgium
R. Van Grieken
Affiliation:
Department of Chemistry, University of Antwerp (UIA), B-2610 Antwerp - Wilrijk, Belgium
Get access

Extract

The incoherently and coherently scattered X-ray intensities with the corresponding scatter factors have been used previously define in a sample matrix the light elements (Z<12) constituents which can not be a s sessed via their fluorescent radiation in conventional XRF. Recently, a more complete sample definition has been achieved based on the backscattered X-rays, by using two excitation modes. However, all quantitative EDXRF methods, based on the scattered radiation from the sample relied hitherto uniquely on the use of monochromatic excitation radiation.

Type
Research Article
Information
Advances in X-Ray Analysis , Volume 33: Thirty-Eighth Annual Conference on Applications of X-ray Analysis, July 31 - August 4, 1989 , 1989 , pp. 515 - 520
Copyright
Copyright © International Centre for Diffraction Data 1989

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1. Nielson, K. K.. Progress in X-ray fluorescence correction methods using scattered radiation. Adv. X-Ray Anal. 22: 303 (1979).Google Scholar
2. Van Dyck, P. M. and Van, R. E. Grieken, Absorption corrections via scattered radiation in energy-dispersive X-ray fluorescence analysis for samples of variable thickness and composition. Anal. Chem., 52: 1859 (1980).Google Scholar
3. Nielson, K. K. and Rogers, V. C., Comparison of X-ray backscatter parameters for complete sample matrix definition. Adv. X-Ray Anal., 27 :449 (1984).Google Scholar
4. Rachetti, A. and Wegscheider, W., A fundamental parameters approach including scattered radiation for monoenergeticalIy excited samples in energy-dispersive X-ray fluorescence spectrometry. Anal. Chim. Acta, 188: 37 (1986).Google Scholar
5. Pella, P. A., Feng, L. and Small, J. A., An analytical algorithm for calculations of spectral distributions of X-ray tubes for quantitative X-ray fluorescence analysis, X-Ray Spectrom., 14 :120 (1985).Google Scholar
6. NieIson, K. K. and Sanders, R. W., Multielemental analysis of unweighed biological and geological samples using backscatter and fundamental parameters. Adv. X-Ray Anal. 26: 385 (1983).Google Scholar
7. Van Dyck, P., Fundamentele studie van de Energiedispersieve X-Stralen-Fluorescentie-Analyse, Ph. D. thesis. University of Antwerp (UIA), Wilrijk, Belgium (1982).Google Scholar
8. He, F. and Van Espen, P., Fundamental parameter sensitivity calibration of Bremsstrahlung EDXRF, Submitted to X-Ray Spectrometry (1989).Google Scholar
9. Araujo, M. F., Van Espen, P. and Van Grieken, R., Sample thickness determination via scattered radiation in X-ray fluorescence spectrometry with filtered continuum excitation. Submitted to X-Ray Spectrometry (1989).Google Scholar
10. Araujo, M. F., He, F., Van Espen, P. and Van Grieken, R., In preparation.Google Scholar
11. McMaster, W. H., Del Gran de, N. K., Mallet, J. H. and Hubbell, J. H., Compilation of X-Ray Cross Sections, UCRL-10174, Lawrence Radiation Laboratory, California University Livermore. CA., Sec, II, Rev. 1 (1969).Google Scholar
12. Van Espen, P., Janssens, K. and Nobels, J., AXIL-PC. Software for the analysis of complex X-ray spectra, Chemometrics and Intelligent Laboratory System, 1: 109 (1986).Google Scholar
13. Clayton, E., Duerden, P. and Cohen, D., A discussion of PIXAN and PIXANPC: the AAEC PIXE analysis computer package, Nucl. Instrum. Methods B, 22: 64 (1987).Google Scholar