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XRFPC: A Program and Data Base for XRF Computations

Published online by Cambridge University Press:  06 March 2019

J. E. Fernandez
J. E. Fernandez*
Affiliation:
Laboratorio di Ingegneria Nucleare di Montecuccolino Universita di Bologna Via dei Colli 16, 40136 Bologna, Italy
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Extract

XRF intensity computations, for polychromatic x-ray sources and multicomponent samples, need a high number of low speed floating-point operations, making them a hard bone for any computer. The evaluations of the Intensity expression require the computation of complex attenuation coefficients. They involve also a spread quantity of atomic data for a high number of elements. And the users need to insert additional information on the experiment, like the excitation-detection geometry or the x-ray tube spectrum, interactively. Personal computers are an optimum target for this kind of application mainly due to the low cost of the computation time and the possibility to display high-resolution graphics. Moreover the increasing power of microprocessors makes it possible to attack hard computations like this on a PC.

Type
Research Article
Information
Advances in X-Ray Analysis , Volume 33: Thirty-Eighth Annual Conference on Applications of X-ray Analysis, July 31 - August 4, 1989 , 1989 , pp. 567 - 572
Copyright
Copyright © International Centre for Diffraction Data 1989

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References

1. McMaster, W. H., Kerr del Grande, H., Mallett, J. H. and Hubbell, J., “Report UCRL 50174,” Lawrence Radiation Laboratory, Livermore (1969) Sec. 2, Rev. 1.Google Scholar
2. Rambynek, W., Crasemann, B., Fink, R. W., Freund, H. U. and Mark, M. Rev. Mod. Phys. 44: 716 (1972).Google Scholar
3. Krause, M. O., J. Phys. Chem. Data 8: 307 (1979).Google Scholar
4. Langemberg, A. and Van Eck, J., J. Phys. B 12: 1331 (1979).Google Scholar
5. Bearden, J. A., Rev. Mod. Phys. 39: 78 (1960).Google Scholar
6. Scoffield, J. H., Phys. Rev. 179: 9 (1969).; A 9: 104 (1974).Google Scholar
7. Hansen, J. S., Freund, H. U. and Fink, R. W., Nucl. Phys. A 142: 213 (1977).Google Scholar
8. Khan, Md. R. and Karimi, M., X-Ray Spectrom. 9: 32 (1980).Google Scholar
9. Sherman, J., J. Spectrochim. Acta 7: 283 (1955).Google Scholar
10. Shiraiwa, T. and Fujino, N., Japan. J. Appl. Phys. 5: 886 (1966).Google Scholar
11. Fernandez, J. E., submitted.Google Scholar
12. Fernandez, J. E. and Rubio, M., submitted.Google Scholar