Hostname: page-component-5c6d5d7d68-vt8vv Total loading time: 0.001 Render date: 2024-08-18T06:17:10.399Z Has data issue: false hasContentIssue false
  • English
  • Français

X-ray Detectors: Pulse Height Shifts, Escape Peaks and Counting Losses

Published online by Cambridge University Press:  06 March 2019

Michael A. Short
Michael A. Short*
Affiliation:
SRS Technologies 3501 Jamboree Roadr #402 Newport Beach, CA 92660
Get access

Extract

With the ever increasing emphasis on computer-controlled hardware, computerized data processing and computer-based display of results, there is a tendency to forget the operating characteristics of some of the older, more mundane, components of X-ray diffractometers and X-ray fluorescence analysis units. We place our trust in the specifications of the components supplied by the equipment manufacturers and, while usually complete, it nevertheless behooves us to be well aware of the operation of the various hardware components of diffractometers and spectrometers.

Type
VII. Solid State and Position-Sensitive Detectors for XRD
Information
Advances in X-Ray Analysis , Volume 34: Thirty-Ninth Annual Conference on Applications of X-ray Analysis, July 30 - August 3, 1990 , 1990 , pp. 319 - 324
Copyright
Copyright © International Centre for Diffraction Data 1990

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1. Knoll, G. F., “Radiation Detection Measurement (2nd ed.)”, 1389, p. 172, John Wiley & Sons.Google Scholar
2. Spielberg, N. & Tsarflas, D. I., “Counting Rate Dependent Gain Shifts in Flow Proportional Counters”, Rev, Sci. Inst., 1975, 46, 1086. 3. Short, M. A, and Bonfiglio, S., Unpublished work.Google Scholar
4. Kelly, C. K., Short, M. A. & Reynolds, C. A., “Pulse Height Stabilisation in Gas Proportional X-Ray Detector Systems”, Proc. Sixth Nat. Conf. on Electron Probe Analysis, Pittsburgh, 1971.Google Scholar
5. Bertin, E. P., “Principles and Practice of X-Ray Spectrometric Analysis”, 1978, p.219–284, Plenum Press.Google Scholar
6. Short, M. A. , Tabock, J. & Hoffman, D. W., “Electron Micrcprobe Analysis of Rare Gases in Thin Metal Films with the Use of Surrogate Standards”, Microbeam Analysis-1980, p. 97, San Francisco Press.Google Scholar
7. Short, M. A. & Tabock, J., “Escape Peak Intensities in Argon/Methane Flow Detectors”, Advances in X-Ray Analysis (ed. D. K.Smith et, al.), 1981, 24. 363, Plenum Pub. Corp.Google Scholar
8. Short, M. A., “The Detection and Correction of Nonlinearity in X-Ray Proportional Counters”, Rev. Sci, Inst., 1960, 31, 618.Google Scholar
9. Burbank, R. D., “Correction for Nonlinearity in X-Fay Co-anting Systems”, Rev. Sci. Inst., 1961, 32, 368.Google Scholar
10. Ruark, A. and Brammer, F. E., “The Efficiency of Counters and counter Circuits”, Phys, Rev., 1937, 52, 322.Google Scholar
11. Jenkins, R., Gould, R. W. & Gedcke,D., “Quantitative X-Ray Spectrometry”, 1981, p. 101 et seq., Marcel Dekker.Google Scholar
12. Petzold, W., “Messung von Zahlverlusten durch Vergleich zweier unabhangiger Zahlkreise”, Z. angew, physik, 1963, 15, 158.Google Scholar