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A Universal Data Base Approach For Quantitative WDXRF Analysis With General Purpose Data Acquisition Algorithms

Published online by Cambridge University Press:  06 March 2019

M. J. Rokosz
Affiliation:
Ford Motor Company Research Staff P. O. Box 2053 Dearborn, MI 48121
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Abstract

Acquisition of new x—ray fluorescence (XRF) hardware or a data reduction computer can be a particularly frustrating experience for analysts who depend upon programs not supplied by the XRF spectrometer manufacturer. Computerized data collection and reduction pragrams generated for a particular spectrameter/computer system can become virtually useless when a significant part af the spectrometer/computer system is replaced. The problem is compounded in a research environment where many different kinds of samples are encountered and many unique analysis programs developed.

The potential magnitude of this problem was recently demonstrated at the Ford Motor Company Scientific Research Laboratory when the thirteen year old computer-contolled XRF analysis system was replaced by a new state-of-the-art spectrometer/computer system.

Type
Research Article
Copyright
Copyright © International Centre for Diffraction Data 1985

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References

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