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A Total reflection X-Ray Spectrograph for Fluorescent Analysis of Light Elements

Published online by Cambridge University Press:  06 March 2019

R. D. Davies  and
H. K. Herglotz
R. D. Davies
Affiliation:
E. I. dn Pont de Nemours & Company, Inc. Engineering Physics Laboratory, Wilmington, Delaware
H. K. Herglotz
Affiliation:
E. I. dn Pont de Nemours & Company, Inc. Engineering Physics Laboratory, Wilmington, Delaware
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Abstract

A novel x-ray spectrograph for the analysis of light elements has been developed based on previous computations and confirming experiments by one of as (H. K. Herglotz). The major components of the instrument are an efficient fluorescent source, a totally reflecting mirror, and an open window photomultiplier. Identification of wavelengths in the range 15 < λ < 80 Å is achieved by the wavelength dependence of the critical angle of reflection of an x-ray beam incident on a suitably chosen low absorption reflector. As the incident angle is increased through the critical angle for a particular wavelength, the reflected beam intensity is sharply reduced; hence, a periodic vibration of the incident beam through a small angular range about the critical angle furnishes a strong a.c. reflected signal characteristic of one narrow wavelength band only.

Initial results promise a simple, easy-to-operate instrument for the routine analysis of elements boron to fluorine.

Type
Research Article
Information
Advances in X-Ray Analysis , Volume 12: Seventeenth Annual Conference on Applications of X-ray Analysis, August 21-23, 1968 , 1968 , pp. 496 - 505
Copyright
Copyright © International Centre for Diffraction Data 1968

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References

1. Herglotz, H. K., “Wavelength Identification of Ultrasoft X-Rays by the Critical Angle of Total Reflection,” J. Appl. Phys. 38: 4565–4568, 1967.Google Scholar
2. Henke, B. L., “Techniques of Low Energy X-Ray and Electron Physics,” Noreleo Reporter XIV, July-December 1967.Google Scholar
3. Harris, L. A., “Surface Analysis of Materials by Electron- Excited Auger Electron Emission,” Advances in X-Ray Anal. 11, 1967 (in print).Google Scholar
4. Siegbahn, K., et al., “Auger Spectra for Elements of Low Atomic Number,” Z. Phys. 192: 476–483, 1966.Google Scholar