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Qualitative Analysis of Complicated Mixtures by Profile Fitting X-Ray Diffractometer Patterns

Published online by Cambridge University Press:  06 March 2019

T. C. Huang  and
William Parrish
T. C. Huang
Affiliation:
IBM Research Laboratory, San Jose, California 95193
William Parrish
Affiliation:
IBM Research Laboratory, San Jose, California 95193
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Abstract

The analysis of mixtures of phases which produce complicated composite x-ray powder patterns is greatly facilitated by use of our profile fitting method and the technique of applying it is illustrated with a five-compound mixture. Profile fitting gave higher precision in the determination of the reflection angles and Intensities and resolved overlaps in a much shorter time than with other methods. If the reference standards are obtained with the same precision, a smaller error window width can b e used in the search/match procedure.

Type
Research Article
Information
Advances in X-Ray Analysis , Volume 21: Twenty-Sixth Annual Conference on Applications of X-ray Analysis, August 3-5, 1977 , 1977 , pp. 275 - 288
Copyright
Copyright © International Centre for Diffraction Data 1977

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References

1. Huang, T.C. and Parrish, W., “Accurate and Rapid Reduction of Experimental X-Ray Data,” Appl. Phys. Lett, 27, 123–124 (1975).Google Scholar
2. Parrish, W., Huang, T.C., and Ayers, G.L., “Profile Pitting: A Powerful Method of Computer X-Ray Instrumentation and Analysis,” Trans. Am, Cryst. Assoc., Vol. 12, 55—74 (1976).Google Scholar
3. Nelder, J.A. and Mead, R., “A Simplex Method for Function Minimization,” Comp. J. 7, 308–313 (1965).Google Scholar
4. Robaux, O., “Analyse des Problemes de Deconvolution,“’ Rev. du Cethedec NS, 74-2, p. 65–66 (1974).Google Scholar
5. Parrish, W., Hamacher, E.A., and Lowitzsch, K., “The Norelco X-Ray Diffractometer,” in Parrish, W., Editor, X-Ray Analysis Papers, p. 71–81 Centrex Publ. (1965).Google Scholar
6. Parrish, W., “Role of Axial Divergence in Powder Diffractometry,” Zeit. Krist. 127, 200–212 (1968).Google Scholar
7. Parrish, W., “Results of the I.U.CR. Precision Lattice Parameter Project,” Acta Cryst. 1l, 838–850 (1960).Google Scholar
8. Newnham, R.E. and de Haan, Y. M., “Refinement of the α-AI2O3, Ti2O3, V2O3, and Cr203 Structures,” Zeit. Krist. 117, 235–237 (1962).Google Scholar
9. Wyckoff, R. W. G., Crystal Structures, Vol. 1, p. 112, John Wiley & Sons (1963).Google Scholar
10. Zachariasen, W.H. and Plettinger, H.A., “Extinction in Quartz,” Acta Cryst. 18, 710–714 (1965).Google Scholar
11. Ladell, J., “Redetermination of the Crystal Structure of Topaz: A Preliminary Account,” Norelco Report 12, 34–39 (1965).Google Scholar
12. Parrish, W., Ayers, G.L., and Huang, T.C., “Rapid Recording and Reduction of X-Ray Diffractometer Data,” Am. Cryst. Assoc,, Michigan State Univ., D6, August 8 (1977).Google Scholar