Hostname: page-component-77c89778f8-9q27g Total loading time: 0 Render date: 2024-07-18T10:33:36.467Z Has data issue: false hasContentIssue false
  • English
  • Français

A Phi-Psi-Diffract (Meter for Residual Stress Measurements

Published online by Cambridge University Press:  06 March 2019

C.N.J. Wagner ,
M.S. Boldrick  and
V. Perez-Mendez
C.N.J. Wagner
Affiliation:
Materials Science and Engineering Department, University of California, Los Angeles, California 90024
M.S. Boldrick
Affiliation:
Materials Science and Engineering Department, University of California, Los Angeles, California 90024
V. Perez-Mendez
Affiliation:
Materials Science and Engineering Department, University of California, Los Angeles, California 90024
Get access

Abstract

A ϕ-ψ diffractometer has been designed and constructed to evaluate residual stresses in polycrystalline samples by x-ray diffraction. It permits rotations of the x-ray diffraction apparatus, consisting of an x-ray tube and a position-sensitive proportional counter, about two axes ϕ and ψ. The ϕ-rotation from 0° to 360° is carried out about the normal to the surface of the stationary sample, whereas the ψ-motion consists of a rotation from -45° to +45° about an axis lying in the sample surface and the diffraction plane, but perpendicular to the diffraction vector. This ϕ-ψ diffractometer permits the application of the ϕ- and ψ-differential and integral methods for the evaluation of the strain tensor and its gradient averaged over the depth of x-ray penetration into the sample. Assuming that isotropic elasticity theory is applicable, the stress tensor can then be evaluated from the measured strain tensor.

Type
V. X-Ray Stress Determination, Position Sensitive Detectors, Fatigue and Fracture Characterization
Information
Advances in X-Ray Analysis , Volume 26: Thirty-First Annual Conference on Applications of X-ray Analysis, August 1-6, 1982 , 1982 , pp. 275 - 282
Copyright
Copyright © International Centre for Diffraction Data 1982

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1. James, M.R. arid Buck, O., Quantitative Nondestructive Measurements of Residual Stresses, CRC Critical Reviews in Solid State Science 9, 61, (1980).Google Scholar
2. Shtbata, M. and Ono, K., NDT International, 14, 227–2, (1981).Google Scholar
3. James, M.R. and Cohen, J.B., Experimental Methods in Materials Science, Treatise on Materials Science and Technology, 19A, 2 (1980).Google Scholar
4. Cullity, B.D., “Elements of X-Ray Diffraction,” 2nd Ed., Addison Wesley Eubl. Co., Reading., Mass. (1978).Google Scholar
5. Various Authors, Harterei-Technische Mitteilungen, 32, No, 1 and 2 (1976).Google Scholar
6. Residual Stress Measurements by X-Ray Diffraction-SAE J784a, (Society of Automotive Engineers, Warrendale, Pa. 1971).Google Scholar
7. Macherauch, E. and Wolfstieg, U., Adv. X-Ray Analysis 20, 369–377 (1977).Google Scholar
8. James, M.R. and Cohen, J.B., J. Testing and Evaluation 6, 91–97 (1978).Google Scholar
9. Wolfstieg, U., private communication.Google Scholar
10. Chrenko, R.H., Adv. X-Ray Analysis 20, 393–2 (1977).Google Scholar
11. Cohen, J.B., Dolle, H., and James, M.R., Proc. of Symposium on Accuracy in Powder Diffraction, National Bureau of Standards Publication 567, 453–2 (1979).Google Scholar
12. Lode, W. and Peiter, A., Harterei-Technische Mitteilungen, 32, 235–2 and 308–2 (1977).Google Scholar
13. Wagner, C.N.J. and Boldrick, M.S., (to be published).Google Scholar
14. Lode, W. and Peiter, A., Metall, 35, 758–2 (1981).Google Scholar
15. Forouhi, A.R., Sleaford, B., Perez-Mendez, V., DeFontaine, D., and Fodor, J., IEEE Trans. Nucl. Science NS-29, 275–2 (1982).Google Scholar