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A Miniature Instrument for Residual Stress Measurement

Published online by Cambridge University Press:  06 March 2019

C. O. Ruud ,
P. S. DiMascio  and
D. J. Snoha
C. O. Ruud
Affiliation:
Materials Research Laboratory, The Pennsylvania State University, University Park, PA 16802
P. S. DiMascio
Affiliation:
Materials Research Laboratory, The Pennsylvania State University, University Park, PA 16802
D. J. Snoha
Affiliation:
Materials Research Laboratory, The Pennsylvania State University, University Park, PA 16802
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Abstract

The Pennsylvania State University has developed and tested a miniature x-ray instrument for the measurement of residual stress (strains). The stress head including x-ray source and detection surface is approximately four and one-half inches long and can be inserted into an orifice less than two and one-half inches in diameter. This head is on the end of a several-foot long cable and is extremely manipulatable.

The instrumentation design is based upon a unique position sensitive scintillation detector which ie capable of applying the single-exposure x-ray stress measurement technique. Total lapse time data collection periods for aluminum alloys are less than ten seconds with x-ray tube powers of 120 watts. Results from a four-point bend test on an aluminum alloy specimen showed excellent precision. The configuration of the instrument and the procedures for its application are described.

Type
III. Position Sensitive Detectors and X-Ray Instrumentation
Information
Advances in X-Ray Analysis , Volume 27: Thirty-Second Annual Conference on Applications of X-ray Analysis, August 1-5, 1983 , 1983 , pp. 273 - 283
Copyright
Copyright © International Centre for Diffraction Data 1983

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References

1. Ruud, C.O., “X-Ray Analysis and Advances in Portable Field Instrumentation,” J. of Met. 31 (6) 10 (1979).Google Scholar
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7. Ruud, C.O., DiMascio, P.S., and Melcher, D.M., “Application of a Position-Sensitive Scintillation Detector For Nondestructive Residual Stress Measurements Inside Stainless Steel Piping,“ Adv. in X-Ray Anal. 26, pp. 233–243.Google Scholar
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