Hostname: page-component-5c6d5d7d68-vt8vv Total loading time: 0.001 Render date: 2024-08-09T15:26:44.695Z Has data issue: false hasContentIssue false
  • English
  • Français

Electron Probe Microanalysis of Zinc-Bearing Hexagonal Ferrites

Published online by Cambridge University Press:  06 March 2019

J. R. Shappirio
J. R. Shappirio*
Affiliation:
U.S. Army Electronics, Command Fort Monmouth, New Jersey
Get access

Abstract

The electron probe is shown to be an effective tool for the analysis of the series of ferrimagnetic oxides referred to as the hexagonal ferrites. This series of compounds) containing barium, Fe3+, and a divalent metal cation, is formed by an ordered stacking of basic structural units in varying ratios. The ideal, complex stoichiornewy of these polytype-like mixed-layer structures can be computed from X-ray unit cell data; the various structures and their predicted stoichiometry are reviewed. Results of electron probe analysis of zinc-bearing single-crystal hexagonal ferrites are compared with theoretical values, the various correction procedures applied to the probe data are presented, and the limitations of the method in the analysis of hexagonal ferrites are discussed. The information obtained from this study has laid the groundwork for the determination of chemistry in substituted members of the hexagonal ferrite group, and will contribute significantly to the interpretation of the magnetic properties exhibited by these compounds.

Type
Research Article
Information
Advances in X-Ray Analysis , Volume 9: Fourteenth Annual Conference on Applications of X-ray Analysis, August 25-27, 1965 , 1965 , pp. 304 - 313
Copyright
Copyright © International Centre for Diffraction Data 1965

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1. Braun, P. B., “The Crystal Structures of a New Group of Ferromagnetic Compounds,” Philips Res. Kept. 12: 491–548 (1957).Google Scholar
2. Smit, J. and Wijn, H. P. J., Ferrites, John Wiley & Sons, Inc., New York (1959), Chapter IX.Google Scholar
3. Savage, R. O. and A. Tauber, “Growth and Properties of Single Crystals of Hexagonal Ferrites,” J. Am. Ceram. Soc. 47: 13 (1964).Google Scholar
4. Kohn, J. A. and Eckart, D. W., Stacking Relations in the Hexagonal Ferrites and a New Series of Mixed-Layer Structures,” Z. Rrist. 119: 454 (1964).Google Scholar
5. Kohn, J. A. and Eckart, D. W., “Mixed-Layer Polytypes related to Magnetoplumbite,” Am. Mineralogist 50: 1371 (1965).Google Scholar
6. Birks, L. S., Electron Probe Microanalysis, Interscience Publishers, New York (1963).Google Scholar
7. Philibert, J., “A Method for Calculating the Ahsorption Corrections in Electron Probe Microanalysis,” X-Ray Optics and X-Ray Microanalysis, Academic Press, Inc., New York (1963), p. 379.Google Scholar
8. Colby, J. W. and Niederrneyer, J. F., “Absorption Correction Tables for Microprobe Analysis,” National Lead Co., Ohio Report No. NLCO-914, Cincinnati (1964).Google Scholar
9. Wittry, D. B., “Fluorescence by Characteristic Radiation in Election Probe Microanalysis,'’ University Southern California, Engineering Center Report No. 84-204 (1962).Google Scholar
10. Colby, J. W., “The Correction for Fluorescence by Characteristic Radiation in Microprobe Analysis,” National Lead Co., Ohio Report No. NLCO-917, Cincinnati (1964).Google Scholar
11. Heinrich, K. F. J., “Tables of Mass Absorption Coefficients,” in: W. M. Meuller, G. R. Mallett, and M. J. Fay (eds.) Advances in X-Ray Analysis, Vol. 8, Plenum Press, New York, 1964.Google Scholar
12. Van Hook, J. and Cvikevich, S., “Single Crystal Hexagonal Ferrites,” Final Report, Contract No. DA-36-039-AMC-00096(E), DA Project No. 1P6 22001 A 057 (1965).Google Scholar
13. Van Hook, J., “Single Crystal Hexagonal Ferrites,” Report No. 1, Contract DA-36-Q39-AMC-00096(E), 1st Quart. Progress Rept. 15 Apr.—14 July 1963.Google Scholar
14. Tauber, A., personal communication.Google Scholar