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Determination of Heavy Metals in Environmental Water by Total Reflection X-Ray Fluorescence Method using Optimized Roentgen Optics Cut-Off Filter

Published online by Cambridge University Press:  06 March 2019

A. I. Egorov ,
L. P. Kablna ,
I. A. Kondurov ,
E. M. Korotkikh ,
V. V. Martynov ,
A. F. Shchebetov  and
P. A. Sushkov
A. I. Egorov
Affiliation:
Neutron Research Division Leningrad Nuclear Physics Institute Gatchina, 188350 U.S.S.R.
L. P. Kablna
Affiliation:
Neutron Research Division Leningrad Nuclear Physics Institute Gatchina, 188350 U.S.S.R.
I. A. Kondurov
Affiliation:
Neutron Research Division Leningrad Nuclear Physics Institute Gatchina, 188350 U.S.S.R.
E. M. Korotkikh
Affiliation:
Neutron Research Division Leningrad Nuclear Physics Institute Gatchina, 188350 U.S.S.R.
V. V. Martynov
Affiliation:
Neutron Research Division Leningrad Nuclear Physics Institute Gatchina, 188350 U.S.S.R.
A. F. Shchebetov
Affiliation:
Neutron Research Division Leningrad Nuclear Physics Institute Gatchina, 188350 U.S.S.R.
P. A. Sushkov
Affiliation:
Neutron Research Division Leningrad Nuclear Physics Institute Gatchina, 188350 U.S.S.R.
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Extract

The total reflection x-ray fluorescence (TXRF) method of analyzing elemental contents Is based on the small angle irradiation of thin samples placed on a total reflecting backing with a narrow photon beam. Two instrumental problems are to be solved here. The first is to form the narrow beam with a small angular deviation. The usual way to solve this problem is to use collimators with small solid angles. These angles must be less than the critical angle for x-ray total reflection, which, in the energy range 10 - 20 keV has an order of magnitude around 10−3 rad.

Type
XII. Total Reflection XRS
Information
Advances in X-Ray Analysis , Volume 35 , Issue B: First Pacific-International Congress on X-ray Analytical Methods (PICXAM). Fortieth Annual Conference on Applications of X-ray Analysis, August 7-16, 1991 , 1991 , pp. 959 - 963
Copyright
Copyright © International Centre for Diffraction Data 1991

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References

1. Aiglnger, H. and Wobrauschek, P., A Method for Quantitative X-Ray Fluorescence Analysis in the Nanogram Region, Nucl, Instr. & Meth. 114, 157–158 (1974).Google Scholar
2. Schwenke, H. and Knoth, J., A Highly Sensitive Energy-Dispersive X-Ray Spectrometer with Multiple Total Reflection of the Exciting Beam, Nucl. Instr. & Meth. 193, 239–243 (1982).10.1016/0029-554X(82)90703-0Google Scholar
3. Kondurov, I. A., Sushkov, P. A., Tukavina, T. M, Shulyak, G. I, Using a. priori Information in EDXRF Analysis of Complex Samples (published elsewhere in these proceedings).Google Scholar