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Computer-Assisted Alignment of a Guinier X-Ray Powder Diffraction System

Published online by Cambridge University Press:  06 March 2019

J.J. Fitzpatrick  and
J.S. Pressnall
J.J. Fitzpatrick
Affiliation:
Chemical and Materials Sciences Division, Denver Research Institute, University of Denver, Denver, CO 80208
J.S. Pressnall
Affiliation:
Chemical and Materials Sciences Division, Denver Research Institute, University of Denver, Denver, CO 80208
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Abstract

Digitized data acquisition and subsequent peak-profile fitting are used in aligning and maintaining the Guinier diffraction system in this laboratory. Utilization of a stepping motor driven goniometer along with profile analysis allows rapid and reproducible alignment while providing a means to investigate the types and magnitudes of errors introduced by various misalignments of the optical system.

Type
III. Position Sensitive Detectors and X-Ray Instrumentation
Information
Advances in X-Ray Analysis , Volume 27: Thirty-Second Annual Conference on Applications of X-ray Analysis, August 1-5, 1983 , 1983 , pp. 317 - 330
Copyright
Copyright © International Centre for Diffraction Data 1983

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