Hostname: page-component-7479d7b7d-68ccn Total loading time: 0 Render date: 2024-07-11T11:25:51.114Z Has data issue: false hasContentIssue false
  • English
  • Français

An Integrated X-Ray Tube - Polarizer EDXRF-Spectrometer in Cartesian Geometry

Published online by Cambridge University Press:  06 March 2019

Robert Rieder ,
Peter Wobrauschek  and
Hannes Aiginger
Robert Rieder
Affiliation:
Atominstitut der Österreichischen Universitäten Schüttelstraße 115, A-1020 Wien, Austria
Peter Wobrauschek
Affiliation:
Atominstitut der Österreichischen Universitäten Schüttelstraße 115, A-1020 Wien, Austria
Hannes Aiginger
Affiliation:
Atominstitut der Österreichischen Universitäten Schüttelstraße 115, A-1020 Wien, Austria
Get access

Abstract

Linear polarized x-rays are used as exciting radiation to reduce the background and to improve the detection limits in XRF. A combination of an x-ray tube and a measuring module realizing a compact cartesian geometry was constructed. An on-line adjustable Bragg-polarizer, a Barkla-polarizer or a secondary target can be used optionally. The anode material of the tube can be changed easily.

Type
XII. Total Reflection XRS
Information
Advances in X-Ray Analysis , Volume 35 , Issue B: First Pacific-International Congress on X-ray Analytical Methods (PICXAM). Fortieth Annual Conference on Applications of X-ray Analysis, August 7-16, 1991 , 1991 , pp. 975 - 980
Copyright
Copyright © International Centre for Diffraction Data 1991

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

[1] Dzubay, T. G., Jarret, B. V. and Jaklevic, J. M., Nucl. Instr. Meth. 115, 297 (1974)Google Scholar
[2] Howell, R. H., Pickles, Wx. and Cate, J. L. Jr., Adv. X-Ray Anal. 18, 265 (1974)Google Scholar
[3] Aiginger, H., Wobrauschek, P. and Brauner, C., Nucl. Instr. Meth. 120, 541 (1974)Google Scholar
[4] Wobrauschek, P. and Aiginger, H., X-Ray Spectrom. 9, 57 (1980)10.1002/xrs.1300090206Google Scholar
[5] Wobrauschek, P. and Aiginger, H., X-Ray Spectrom. 12, 72 (1983)Google Scholar
[6] Wobrauschek, P. and Aiginger, H., Adv. X-Ray Anal. 28, 69 (1985)Google Scholar
[7] Ryon, R. W., Zahrt, J. D., Wobrauschek, P. and Aiginger, H., Adv. X-Ray Anal. 25, 63 (1982)Google Scholar
[8] Maddox, W. E., Adv. X-Ray Anal. 27, 519 (1984)Google Scholar
[9] Maddox, W. E. and Kelliher, W. C., Adv. X-Ray Anal. 29,497 (1986)Google Scholar
[10] Ryon, R. W. and Zahrt, J. D., Adv. X-Ray Anal. 22, 453 (1979)Google Scholar
[11] Zahrt, J. D., Adv. X-Ray Anal. 26, 331 (1983)Google Scholar
[12] Zahrt, J. D., Nucl. Instr. Meth. A242, 558 (1986)Google Scholar
[13] Rousseau, R. M., X-Ray Spectrom. 13, 115 (1984)10.1002/xrs.1300130306Google Scholar
[14] Ryon, R. W., Adv. X-Ray Anal. 20, 575 (1977)Google Scholar
[15] Ryon, R. W. and Zahrt, J. D., UCRL Report 102936, Lawrence Livermore Lab. (1990)Google Scholar