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Electronic and Optoelectronic Properties of Semiconductor Structures
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Book description

A graduate textbook presenting the underlying physics behind devices that drive today's technologies. The book covers important details of structural properties, bandstructure, transport, optical and magnetic properties of semiconductor structures. Effects of low-dimensional physics and strain - two important driving forces in modern device technology - are also discussed. In addition to conventional semiconductor physics the book discusses self-assembled structures, mesoscopic structures and the developing field of spintronics. The book utilizes carefully chosen solved examples to convey important concepts and has over 250 figures and 200 homework exercises. Real-world applications are highlighted throughout the book, stressing the links between physical principles and actual devices. Electronic and Optoelectronic Properties of Semiconductor Structures provides engineering and physics students and practitioners with complete and coherent coverage of key modern semiconductor concepts. A solutions manual and set of viewgraphs for use in lectures are available for instructors, from


‘I have often recommended Singh’s texts in the past, and I intend to do the same with this present one … represents good value for money …’

Source: Contemporary Physics

‘The book is capable of being used for a classical course on semiconductor physics or a more specialized course on advanced topics … The writing style is clear and concise and the figures are of high quality … this book is a welcome addition to the textbooks available on semiconductor physics. it has been written with great thought placed on the presentation of the material … Importantly, it has a price accessible to students and will retain its value for many years to come.’

Source: Materials Today

'Professor Singh has produced another excellent volume that will be a valuable source for both new entrants and the established in the field of optoelectronic semiconductor structures.'

Source: IEEE Circuits and Devices Magazine

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