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Early Results from an Aberration-Corrected JEOL 2200FS STEM/TEM at Oak Ridge National Laboratory
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- Journal:
- Microscopy and Microanalysis / Volume 12 / Issue 6 / December 2006
- Published online by Cambridge University Press:
- 11 October 2006, pp. 483-491
- Print publication:
- December 2006
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- Article
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