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Plasma Focused Ion Beam Serial Sectioning as a Technique to Characterize Nonmetallic Inclusions in Superelastic Nitinol Fine Wires
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- Journal:
- Microscopy and Microanalysis / Volume 26 / Issue 6 / December 2020
- Published online by Cambridge University Press:
- 08 December 2020, pp. 1088-1099
- Print publication:
- December 2020
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X-Ray Excited Optical Luminescence and Portable Electron Probe Microanalyzer–Cathodoluminescence (EPMA–CL) Analyzers for On-Line and On-Site Analysis of Nonmetallic Inclusions in Steel
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- Journal:
- Microscopy and Microanalysis / Volume 23 / Issue 6 / December 2017
- Published online by Cambridge University Press:
- 27 November 2017, pp. 1143-1149
- Print publication:
- December 2017
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- Article
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