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Method for Cross-sectional Thin Specimen Preparation from a Specific Site Using a Combination of a Focused Ion Beam System and Intermediate Voltage Electron Microscope and Its Application to the Characterization of a Precipitate in a Steel
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- Journal:
- Microscopy and Microanalysis / Volume 7 / Issue 3 / May 2001
- Published online by Cambridge University Press:
- 02 February 2002, pp. 287-291
- Print publication:
- May 2001
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- Article
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