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Can a Programmable Phase Plate Serve as an Aberration Corrector in the Transmission Electron Microscope (TEM)?
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- Journal:
- Microscopy and Microanalysis , FirstView
- Published online by Cambridge University Press:
- 05 September 2022, pp. 1-10
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Determination of Electron Optical Properties for Aperture Zoom Lenses Using an Artificial Neural Network Method
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- Journal:
- Microscopy and Microanalysis / Volume 22 / Issue 2 / April 2016
- Published online by Cambridge University Press:
- 16 February 2016, pp. 458-462
- Print publication:
- April 2016
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