2 results
EDS Measurements of X-Ray Intensity at WDS Precision and Accuracy Using a Silicon Drift Detector
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- Journal:
- Microscopy and Microanalysis / Volume 18 / Issue 4 / August 2012
- Published online by Cambridge University Press:
- 30 July 2012, pp. 892-904
- Print publication:
- August 2012
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- Article
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Compositional Averaging of Backscatter Intensities in Compounds
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- Journal:
- Microscopy and Microanalysis / Volume 9 / Issue 3 / June 2003
- Published online by Cambridge University Press:
- 23 May 2003, pp. 202-215
- Print publication:
- June 2003
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- Article
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