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Precise Measurement of Carrier Concentrations in n-Type GaN by Phase-Shifting Electron Holography
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- Journal:
- Microscopy and Microanalysis / Volume 25 / Issue S2 / August 2019
- Published online by Cambridge University Press:
- 05 August 2019, pp. 50-51
- Print publication:
- August 2019
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Influence of Annealing on the 1.5 μm Light Emission of Er-doped ZnO Thin Films and its Crystal Quality
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- Journal:
- Journal of Materials Research / Volume 20 / Issue 9 / September 2005
- Published online by Cambridge University Press:
- 03 March 2011, pp. 2578-2582
- Print publication:
- September 2005
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