4 results
Damage-less Chemical State Analysis by Using Soft X-ray Emission Spectroscopy in Low Voltage SEM
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- Journal:
- Microscopy and Microanalysis / Volume 23 / Issue S1 / July 2017
- Published online by Cambridge University Press:
- 04 August 2017, pp. 1842-1843
- Print publication:
- July 2017
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Low Voltage Soft X-ray Emission Analysis from 100V for Depth Chemical Information from a few nm to several hundred nm
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- Journal:
- Microscopy and Microanalysis / Volume 22 / Issue S3 / July 2016
- Published online by Cambridge University Press:
- 25 July 2016, pp. 422-423
- Print publication:
- July 2016
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Recent Achievements of Electron Beam Deceleration Method for FE-SEM Enhanced Elemental Analysis including Soft X-ray Emission Spectroscopy
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- Journal:
- Microscopy and Microanalysis / Volume 20 / Issue S3 / August 2014
- Published online by Cambridge University Press:
- 27 August 2014, pp. 686-687
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- August 2014
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Characterization of Fine Surface Structure with a New Electron Detection System in FE-SEM
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- Journal:
- Microscopy and Microanalysis / Volume 18 / Issue S2 / July 2012
- Published online by Cambridge University Press:
- 23 November 2012, pp. 932-933
- Print publication:
- July 2012
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