2 results
Strain Distribution Analysis during Tensile Deformation of Silicon Nanowire with 4D-STEM
-
- Journal:
- Microscopy and Microanalysis / Volume 28 / Issue S1 / August 2022
- Published online by Cambridge University Press:
- 22 July 2022, pp. 1918-1920
- Print publication:
- August 2022
-
- Article
-
- You have access
- Export citation
Identifying Possible Two-Level-System Sources in Superconducting Qubit with Advanced Electron Microscopy
-
- Journal:
- Microscopy and Microanalysis / Volume 28 / Issue S1 / August 2022
- Published online by Cambridge University Press:
- 22 July 2022, pp. 1716-1717
- Print publication:
- August 2022
-
- Article
-
- You have access
- Export citation