12 results
Contact Resistance Study of Pt, Ni and Au on La0.7Sr0.3MnO3 (LSMO)/Si for Heterojunction Device Applications
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- Journal:
- MRS Online Proceedings Library Archive / Volume 1507 / 2013
- Published online by Cambridge University Press:
- 05 August 2013, mrsf12-1507-aa12-39
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- 2013
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OFET Sensors with Poly 3-hexylthiophene and Pentacene as Channel Materials for Ionizing Radiation
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- Journal:
- MRS Online Proceedings Library Archive / Volume 1383 / 2012
- Published online by Cambridge University Press:
- 07 February 2012, mrsf11-1383-a08-14
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- 2012
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Copper (II) Phthalocyanine Based Field Effect Transistors as Total Dose Sensors for Determining Ionizing Radiation Dose
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- Journal:
- MRS Online Proceedings Library Archive / Volume 1383 / 2012
- Published online by Cambridge University Press:
- 07 February 2012, mrsf11-1383-a08-15
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- 2012
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High Yield Polymer MEMS Process for CMOS/MEMS Integration
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- Journal:
- MRS Online Proceedings Library Archive / Volume 1299 / 2011
- Published online by Cambridge University Press:
- 20 January 2011, mrsf10-1299-s04-12
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- 2011
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Ionizing Radiation Total Dose Detectors Using Oligomer Organic Semiconductor Material and Devices
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- Journal:
- MRS Online Proceedings Library Archive / Volume 1312 / 2011
- Published online by Cambridge University Press:
- 17 June 2011, mrsf10-1312-hh03-10
- Print publication:
- 2011
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SU8 / modified MWNT composite for piezoresistive sensor application
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- Journal:
- MRS Online Proceedings Library Archive / Volume 1299 / 2011
- Published online by Cambridge University Press:
- 20 January 2011, mrsf10-1299-s04-11
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- 2011
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Effect of Technology Scaling on MOS Transistor Performance with High-K Gate Dielectrics
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- Journal:
- MRS Online Proceedings Library Archive / Volume 716 / 2002
- Published online by Cambridge University Press:
- 01 February 2011, B3.3
- Print publication:
- 2002
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Degradation Study of Ultra-thin JVD Silicon Nitride Mnsfets
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- Journal:
- MRS Online Proceedings Library Archive / Volume 716 / 2002
- Published online by Cambridge University Press:
- 01 February 2011, B4.18
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- 2002
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Device Scaling Effects on Substrate Enhanced Degradation in MOS Transistors
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- Journal:
- MRS Online Proceedings Library Archive / Volume 716 / 2002
- Published online by Cambridge University Press:
- 01 February 2011, B7.2
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- 2002
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Suppression of Parasitic BJT Action in Single Pocket Thin Film Deep Sub-Micron SOI MOSFETs.
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- Journal:
- MRS Online Proceedings Library Archive / Volume 716 / 2002
- Published online by Cambridge University Press:
- 01 February 2011, B1.1
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- 2002
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Electrically Induced Junction MOSFET for High Performance Sub-50nm CMOS Technology
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- Journal:
- MRS Online Proceedings Library Archive / Volume 716 / 2002
- Published online by Cambridge University Press:
- 01 February 2011, B7.6
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- 2002
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Effective Dielectric Thickness Scaling for High-K Gate Dielectric Mosfets
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- Journal:
- MRS Online Proceedings Library Archive / Volume 716 / 2002
- Published online by Cambridge University Press:
- 01 February 2011, B4.19
- Print publication:
- 2002
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