38 results
Slow positron production and storage for the ASACUSA-Cusp experiment
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- Journal of Plasma Physics / Volume 89 / Issue 6 / December 2023
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- 18 December 2023, 905890608
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Synchrotron radiation X-ray diffraction analysis for Bi-based oxide superconducting wire
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- Diamond Light Source Proceedings / Volume 1 / Issue SRMS-7 / October 2010
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- 01 November 2010, e108
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- October 2010
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Observation of Magnetic and Electric Field in STEM by using CCD camera
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- Microscopy and Microanalysis / Volume 15 / Issue S2 / July 2009
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- 26 July 2009, pp. 1058-1059
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- July 2009
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Development of a 200kV Atomic Resolution Analytical Electron Microscope
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- Microscopy and Microanalysis / Volume 15 / Issue S2 / July 2009
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- 26 July 2009, pp. 188-189
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- July 2009
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Removal of pathogenic human viruses by insoluble pyridinium-type resin
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- Epidemiology & Infection / Volume 105 / Issue 3 / December 1990
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- 15 May 2009, pp. 633-642
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Development of a 200kV Atomic Resolution Analytical Electron Microscope
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- Microscopy Today / Volume 17 / Issue 3 / May 2009
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- 14 March 2018, pp. 8-11
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- May 2009
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Restriction map and α-amylase activity variation among Drosophila mutation accumulation lines
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- Genetical Research / Volume 54 / Issue 3 / December 1989
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- 14 April 2009, pp. 197-203
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Three-Dimensional Magnetic Domain Analysis by Lorentz Tomography
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- Microscopy and Microanalysis / Volume 12 / Issue S02 / August 2006
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- 31 July 2006, pp. 984-985
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- August 2006
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Quantitative Analysis of Atomic Resolution HAADF-STEM (Z-contrast) Imaging for PbTiO3 / SrTiO3 Substrate Dielectric Thin Films
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- Microscopy and Microanalysis / Volume 12 / Issue S02 / August 2006
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- 31 July 2006, pp. 1352-1353
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- August 2006
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Residual Strain Measurement of SOI Wafer Using Convergent Beam Electron Diffraction
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- Microscopy and Microanalysis / Volume 11 / Issue S02 / August 2005
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- 01 August 2005, pp. 776-777
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- August 2005
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Improving Resolution of HAADF STEM Images with Maximum Entropy Method and Deconvolution Processing
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- Microscopy and Microanalysis / Volume 11 / Issue S02 / August 2005
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- 01 August 2005, pp. 1476-1477
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- August 2005
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Measurement of 3rd Order Spherical Aberration Coefficient for Scanning Transmission Electron Microscopy
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- Microscopy and Microanalysis / Volume 11 / Issue S02 / August 2005
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- 01 August 2005, pp. 2166-2167
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- August 2005
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Effective Orientation Control of Pb(Zr0.4Ti0.6)O3 Thin Films Using A New Ti/Pb(Zr0.4Ti0.6)O3 Seeding Layer
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- MRS Online Proceedings Library Archive / Volume 784 / 2003
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- 01 February 2011, C7.5
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- 2003
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High-Resolution HAADF STEM of Inversion Boundaries in Sb2O3-Doped Zinc Oxide
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- Microscopy and Microanalysis / Volume 8 / Issue S02 / August 2002
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- 01 August 2002, pp. 494-495
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- August 2002
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Deconvolution Process of High-Resolution HAADF STEM Images
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- Microscopy and Microanalysis / Volume 8 / Issue S02 / August 2002
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- 01 August 2002, pp. 492-493
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- August 2002
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Atomic Scale Grain Boundary Analysis by Incoherent Imaging With TEM/STEM
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- Microscopy and Microanalysis / Volume 6 / Issue S2 / August 2000
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- 02 July 2020, pp. 124-125
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- August 2000
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