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The Outward Diffusion of Sb during Nanowire Growth Studied by Quantitative High-Angle Annular Dark Field Scanning Transmission Electron Microscopy
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- Journal:
- Microscopy and Microanalysis / Volume 20 / Issue S3 / August 2014
- Published online by Cambridge University Press:
- 27 August 2014, pp. 186-187
- Print publication:
- August 2014
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- Article
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A method to avoid strain field induced artifacts in 2d chemical mapping of dilute GaNAs by HAADF STEM
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- Journal:
- Microscopy and Microanalysis / Volume 18 / Issue S2 / July 2012
- Published online by Cambridge University Press:
- 23 November 2012, pp. 1028-1029
- Print publication:
- July 2012
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