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Characterization of interface quality between various low-temperature oxides and Si using room-temperature-photoluminescence and Raman spectroscopy
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- Journal:
- Journal of Materials Research / Volume 28 / Issue 9 / 14 May 2013
- Published online by Cambridge University Press:
- 09 May 2013, pp. 1269-1277
- Print publication:
- 14 May 2013
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- Article
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