4 results
Atomic Scale Analysis of Dopants in CMOS Structures by Atom Probe Tomography
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- Journal:
- Microscopy and Microanalysis / Volume 22 / Issue S3 / July 2016
- Published online by Cambridge University Press:
- 25 July 2016, pp. 1534-1535
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- July 2016
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Preparation and Analysis of Atom Probe Tips by Xenon Focused Ion Beam Milling
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- Journal:
- Microscopy and Microanalysis / Volume 22 / Issue 3 / June 2016
- Published online by Cambridge University Press:
- 08 April 2016, pp. 576-582
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- June 2016
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3D Atomic Scale Analysis of CMOS type structures for 14 nm UTBB-SOI technology
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- Journal:
- Microscopy and Microanalysis / Volume 21 / Issue S3 / August 2015
- Published online by Cambridge University Press:
- 23 September 2015, pp. 521-522
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- August 2015
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A Comparative Analysis of a Si/SiGe Heterojunction-Bipolar Transistors: APT, STEM-EDX and ToF-SIMS
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- Journal:
- Microscopy and Microanalysis / Volume 21 / Issue S3 / August 2015
- Published online by Cambridge University Press:
- 23 September 2015, pp. 689-690
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- August 2015
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