4 results
Nanoparticle Localization Using Gabor Filters
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- Journal:
- Microscopy and Microanalysis / Volume 28 / Issue S1 / August 2022
- Published online by Cambridge University Press:
- 22 July 2022, pp. 3120-3122
- Print publication:
- August 2022
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CDrift: An Algorithm to Correct Linear Drift From A Single High-Resolution STEM Image
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- Journal:
- Microscopy and Microanalysis / Volume 26 / Issue 5 / October 2020
- Published online by Cambridge University Press:
- 24 July 2020, pp. 913-920
- Print publication:
- October 2020
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Compositional Analysis with Atomic Column Spatial Resolution by 5th-Order Aberration-Corrected Scanning Transmission Electron Microscopy
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- Journal:
- Microscopy and Microanalysis / Volume 17 / Issue 4 / August 2011
- Published online by Cambridge University Press:
- 27 May 2011, pp. 578-581
- Print publication:
- August 2011
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Quantitative Strain Mapping Applied to Aberration-Corrected HAADF Images
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- Journal:
- Microscopy and Microanalysis / Volume 12 / Issue 4 / August 2006
- Published online by Cambridge University Press:
- 14 July 2006, pp. 285-294
- Print publication:
- August 2006
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