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Structural and Electronic Properties of Ti Doped ZnO: XRD, TEM, EELS and Ab-initio Simulations
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- Journal:
- Microscopy and Microanalysis / Volume 23 / Issue S1 / July 2017
- Published online by Cambridge University Press:
- 04 August 2017, pp. 1686-1687
- Print publication:
- July 2017
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Book Review - R. L. Snyder, J. Fiala, and H. J. Bunge: “Defect and Microstructure Analysis by Diffraction,” International Union of Crystallography (Oxford University Press, New York, 1999), ISBN 0 19 850189 7.
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- Journal:
- Powder Diffraction / Volume 15 / Issue 3 / September 2000
- Published online by Cambridge University Press:
- 10 January 2013, p. 202
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Phase Control and Stability of Thin Silicon Films Deposited from Silane Diluted with Hydrogen
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- Journal:
- MRS Online Proceedings Library Archive / Volume 989 / 2007
- Published online by Cambridge University Press:
- 01 February 2011, 0989-A08-01
- Print publication:
- 2007
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