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Exploring Local Crystal Symmetry with Rotationally Invariant Variational Autoencoders
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- Microscopy and Microanalysis / Volume 28 / Issue S1 / August 2022
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- 22 July 2022, pp. 3132-3134
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- August 2022
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Exploring Local Physics and Structural Behaviors with Automated Experiment In 4D-STEM
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- Microscopy and Microanalysis / Volume 28 / Issue S1 / August 2022
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- 22 July 2022, pp. 2944-2946
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- August 2022
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On the ergodicity of a class of level-dependent quasi-birth-and-death processes
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- Advances in Applied Probability / Volume 51 / Issue 4 / December 2019
- Published online by Cambridge University Press:
- 15 November 2019, pp. 1109-1128
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- December 2019
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Distinguishability of Structures via Principal Component Analysis: Application to 4D STEM
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- Microscopy and Microanalysis / Volume 25 / Issue S2 / August 2019
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- 05 August 2019, pp. 126-127
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- August 2019
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Spatial and Temporal Incoherence in Scanning Diffraction and Differential Phase Contrast
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- Microscopy and Microanalysis / Volume 25 / Issue S2 / August 2019
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- 05 August 2019, pp. 78-79
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- August 2019
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Following the Electrons: Simulation for High-Resolution STEM and CBED
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- Microscopy and Microanalysis / Volume 25 / Issue S2 / August 2019
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- 05 August 2019, pp. 2680-2681
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- August 2019
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Accurate Calculation of CBED Patterns for 4D STEM Using Electron Densities Calculated by Density Functional Theory.
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- Microscopy and Microanalysis / Volume 24 / Issue S1 / August 2018
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- 01 August 2018, pp. 116-117
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- August 2018
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Quantification of Low Voltage Images of 2-dimensional Materials in Aberration Corrected Scanning Transmission Electron Microscopy.
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- Microscopy and Microanalysis / Volume 23 / Issue S1 / July 2017
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- 04 August 2017, pp. 464-465
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- July 2017
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Identifying Novel Polar Distortion Modes in Engineered Magnetic Oxide Superlattices
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- Microscopy and Microanalysis / Volume 23 / Issue S1 / July 2017
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- 04 August 2017, pp. 1590-1591
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- July 2017
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Low-Loss Imaging of Defect Structures in Two Dimensional Materials Using Aberration Corrected Scanning Transmission Electron Microscopy
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- Microscopy and Microanalysis / Volume 22 / Issue S3 / July 2016
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- 25 July 2016, pp. 1410-1411
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- July 2016
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Single Atom Imaging and Spectroscopy of Impurities in 2D Materials
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- Microscopy and Microanalysis / Volume 22 / Issue S3 / July 2016
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- 25 July 2016, pp. 862-863
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- July 2016
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Inversion of STEM EELS Data to Obtain Site Occupancy and Near Edge Structure
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- Microscopy and Microanalysis / Volume 21 / Issue S3 / August 2015
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- 23 September 2015, pp. 2251-2252
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- August 2015
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Atomic Scale Studies of La/Sr Ordering in Colossal Magnetoresistant La2−2xSr1+2xMn2O7 Single Crystals
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- Microscopy and Microanalysis / Volume 20 / Issue 6 / December 2014
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- 29 September 2014, pp. 1791-1797
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- December 2014
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Inelastic STEM Imaging Based on Low-Loss Spectroscopy
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- Microscopy and Microanalysis / Volume 20 / Issue S3 / August 2014
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- 27 August 2014, pp. 90-91
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- August 2014
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Understanding Individual Defects in CdTe Solar Cells: From Atomic Structure to Electrical Activity
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- Microscopy and Microanalysis / Volume 20 / Issue S3 / August 2014
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- 27 August 2014, pp. 518-519
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- August 2014
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Simulation of Probe Position-Dependent Electron Energy-Loss Fine Structure
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- Microscopy and Microanalysis / Volume 20 / Issue 3 / June 2014
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- 31 March 2014, pp. 784-797
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- June 2014
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Single Atom Microscopy
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- Microscopy and Microanalysis / Volume 18 / Issue 6 / December 2012
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- 12 November 2012, pp. 1342-1354
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- December 2012
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Spatial Resolution and Information Transfer in Scanning Transmission Electron Microscopy
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- Microscopy and Microanalysis / Volume 14 / Issue 1 / February 2008
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- 03 January 2008, pp. 36-47
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- February 2008
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Modeling Atomic-Resolution Scanning Transmission Electron Microscopy Images
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- Microscopy and Microanalysis / Volume 14 / Issue 1 / February 2008
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- 21 December 2007, pp. 48-59
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- February 2008
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Letter to the Editor: Limitations to the Measurement of Oxygen Concentrations by HRTEM Imposed by Surface Roughness
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- Microscopy and Microanalysis / Volume 11 / Issue 2 / April 2005
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- 08 March 2005, pp. 111-113
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- April 2005
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