4 results
Evaluation of Automated Particle Picking for Cryo-EM Using High Precision TEM Simulation by Utilizing a Multi-slice Method
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- Journal:
- Microscopy and Microanalysis / Volume 26 / Issue S2 / August 2020
- Published online by Cambridge University Press:
- 30 July 2020, pp. 2312-2313
- Print publication:
- August 2020
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First Demonstration of Phase Contrast Scanning Transmission Electron Microscopy
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- Journal:
- Microscopy and Microanalysis / Volume 20 / Issue S3 / August 2014
- Published online by Cambridge University Press:
- 27 August 2014, pp. 224-225
- Print publication:
- August 2014
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Ultrahigh-Vacuum Third-Order Spherical Aberration (Cs) Corrector for a Scanning Transmission Electron Microscope
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- Journal:
- Microscopy and Microanalysis / Volume 12 / Issue 6 / December 2006
- Published online by Cambridge University Press:
- 11 October 2006, pp. 456-460
- Print publication:
- December 2006
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Cs Corrector for Imaging
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- Journal:
- Microscopy and Microanalysis / Volume 10 / Issue S02 / August 2004
- Published online by Cambridge University Press:
- 01 August 2004, pp. 976-977
- Print publication:
- August 2004
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