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6 results

  • CRL optics and silicon drift detector for P06 Microprobe experiments at 35 keV

  • Gerald Falkenberg, Frank Seiboth, Frieder Koch, Ken Vidar Falch, Andreas Schropp, Dennis Brückner, Jan Garrevoet
  • Journal: Powder Diffraction / Volume 35 / Issue S1 / December 2020
  • Published online by Cambridge University Press: 05 August 2020, pp. S34-S37
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  • A provisional setup for X-ray microprobe experiments at 35 keV is described. It is based on compound refractive lenses (CRLs) for nanofocusing and a Vortex silicon drift detector with 2 mm sensor thickness for increased sensitivity at high energies. The Microprobe experiment (PETRA III) generally uses Kirkpatrick-Baez mirrors for submicrometer focusing in the energy range of 5–21 keV. However, various types of scanning X-ray microscopy experiments require higher excitation energies. The CRL optics were characterized by X-ray ptychography and X-ray fluorescence (XRF) knife edge scans on a siemens star pattern and showed beam sizes down to 110 nm. The performance of the new setup for microscopic X-ray diffraction (XRD)–XRF scanning X-ray microscopy measurements at 35 keV is demonstrated on a cross-section of a painting fragment.